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3DP is a non-contact optical metrology technique which provides measurement of the physical characteristics of a material including :-
3DP can provide quantification of surface topography and accurate measurement of dimensions. The Technique The 3DP technique combines white light illumination of the sample with spatial filtering in a confocal microscope system to provide measurement of the height of the sample (z-axis) as it is moved across the detection plane using an XY translation stage. The resolution of the measurements are <1µm in X and Y axes and <10nm in the z-axis. Hence microfeatures and large scale topographic variations can be monitored in detail. Sample sizes from a few mm2 to 100mm x 100mm can be measured with a height variation over the sample of up to ~25mm. Resolution xy resolution <1micron
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