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Example Reports

Below is a selection of the type of work undertaken for the materials industries.


CSMA Report Titles relating to the Materials Industries

  • XPS Analysis of Modified Ceramic Surfaces and Stainless Steel Sample
  • Analysis of a Black Coating on Ceramic Bakeware
  • ToFSIMS Investigation of Egg Soiling on Steel and Ceramic Surfaces
  • XPS Investigation of Contamination Spots on Gold Tracks on Ceramic
  • Analysis of Textile Products for Ceramic Additives
  • XPS Analysis of Ceramic Fabric and Gold Foil Samples
  • Investigation into the Tarnishing of Gold Decoration on Ceramic Ware
  • XPS Analysis of Ceramic Fabric and Aluminium Foil Samples
  • Analysis and Elemental Mapping of Silicone/Biomaterial Coated Ceramic Chips
  • XPS Analysis of Treated Ceramic Chips
  • Analysis of a Ceramic Material by XPS (ESCA)
  • ToF-SIMS Analysis of Untreated Ceramic Chips
  • Analysis of Ceramic Exhaust Trap Washings
  • Characterisation of a Ceramic Exhaust Gas Trap using Surface Analysis and Surface Area Measurement Techniques
  • Analysis of Surface Modified Ceramic Chips by XPS
  • XPS Analysis of Cleaned Metal and Ceramic Coupons
  • Analysis of Stainless Steel and Ceramics
  • Investigation into the Cause of Discolouration of the Surface of Ceramic Beads for Micro-Milling using Surface Analysis
  • Surface Characterisation of Cleaned and Silanated Ceramics using Angle Dependent XPS
  • Surface Characterisation of Ceramic, Glass and Stainless Steel using ToF-SIMS
  • XPS Characterisation of Treated Hydroxylated Alumina Ceramic Chips
  • Surface Characterisation of Silanated Ceramics using Angle Dependent XPS
  • Investigation into Hole Defects in Doped Barium Titanate Ceramics using Imaging SIMS
  • A Combined XPS / Contact Angle Study of Untreated and Hydroxylated Alumina Ceramic Chips
  • An XPS investigation of surface staining on ceramic chip capacitors
  • SIMS Analysis of Treated Dentine
  • Analyses of Calcium Bromide Solution, before and after CO2 bubbling
  • XPS Analysis of 'Smokey' Deposit on a Quartz Lamp Body
  • ToFSIMS Analysis of Hair Samples
  • Comparative Analysis of Three Calcium Bromide Powders - “Bubbling” Investigation
  • Investigation into Visual Defects at Methacrylate Bonded Glass Bevel Interfaces.
  • XPS Analysis of Silane Solutions Showing Yellowing
  • Surface Analysis of Staining on a Platinum Thermocouple
  • ToFSIMS Investigation of Egg Soiling on Steel and Ceramic Surfaces
  • Investigation into Blockage of Glass Bores used in Max/Min Thermometers
  • DSIMS Profiling of Plated Zinc Handles
  • Depth Profile Analysis of Razor Blade Edges.
  • Analysis of Material from Inside Vacuum Chamber
  • DSIMS Analysis of a PVC Sample
  • SEM Imaging of Perfume Powders.
  • ToF-SIMS Analysis of Washed Repellent Coated Textiles
  • XPS Analysis of Polystyrene
  • Quantitative Calculation of Solar Insolation on Shaded Vertical Surfaces.
  • Surface Analysis of Plate Samples
  • Consultancy Report on Coating Thickness Applied to Pinnacled Substrates.
  • Analysis of Indices and Coated Glass Capillaries following Improved Coating Processes using XPS
  • Surface Analysis of Egg Soiling on Glass
  • Investigation into sinking indices in mercury-free max:min thermometers using XPS
  • An investigation into the declining levels of the preservative X in drug Z suspension stored in sachets, using XPS and SIMS
  • Analysis of Treated Hair and Dyed Cotton using ToF-SIMS
  • Low Temperature ToF-SIMS Analysis of Four Hair Swatches Treated with Different Conditioners
  • Surface Analysis of Tiles Treated with Toilet Cleaning Products
  • The Characterisation of Glazed Tile Surfaces using Surface Analysis Techniques
  • Services to Support the Manufacture of Rainwater Goods
  • TD-GC-MS Analysis of Headspace Organic Vapours from Confectionery Packaging
  • Analysis of Crater Defects on Wallpaper Coatings
  • Investigation of Delamination in Floor Tiles using XPS and ToF-SIMS
  • Analysis of Two Polymer Emulsions
  • Initial Investigation into the Distribution of Furniture Polish Components on a Lacquer Surface using Surface Analysis Methods
  • Analysis of Material from Build up on Rollers
  • Analysis of a Paper Product for the Presence of a Silicone Coating using ToF-SIMS
  • Surface Analysis of Phosphoryl Choline (PC) Treated Resin Samples by XPS
  • XPS and ToF-SIMS Characterisation of Silicone Polymer Distribution on Acrylic Tiles
  • An Investigation into the Cause of Blockage of Reverse Osmosis (Ro) Membranes using ToF-SIMS.
  • Surface Analysis of Coated Stainless Steel Coupons by XPS
  • Investigation of Fluoride Solubility Differences Between Children's Toothpaste Prepared by Two Different Processes
  • Surface Analysis of Cleaned and Polished & Quartz Lenses
  • Determination of the Total Tin and Phosphorus Concentrations in Four Cosmetic Emulsions
  • Surface Characterisation of PC Based Coating on Hydroxy-Apatite Discs and Acrylic Tiles
  • FT-IR and ToF-SIMS Analysis of Dry 'Prepaste'
  • Investigation of Fluoride Solubility Differences in Children's Toothpaste Prepared by Two Different Processes
  • Investigation into the Cause of Staining on Foil Lids for Facial Wipe Containers.
  • Investigation into Spot Defects on Flooring using Surface Analysis Methods
  • Surface Characterisation of Heparin Coatings using XPS
  • Comparison Analysis of Four Filter Tow Fibres Using ToFSIMS
  • XPS Analysis of a Grey Deposit
  • Analysis of a Deposit from a Cooled Roller using FT-IR
  • Analysis of Vinyl Base by ToF-SIMS
  • Surface Composition and Silicone Distribution Studies of Acrylic Tiles
  • Surface Chemical Analysis of Two Limestone Slabs to Investigate Silicone Sealant Migration
  • Surface Characterisation of Organic Coatings on Stainless Steel using ToF-SIMS
  • An Investigation of White Staining on Resin-Coated Silicon Wafers by DSIMS and ToF-SIMS
  • Investigation of Novel Polymer Technologies for Surface Modification to Prevent Soil Sticking on Toilet Bowls
  • Analysis of Additional Coated Stainless Steel and Polycarbonate Surfaces by XPS
  • A SEM/EDX and LIMA Analysis of Defects in Chrome Plated Taps.
  • Analysis of Coated Polycarbonate and Stainless Steel Surfaces using XPS
  • Investigation into the Water Repellent Nature of Two Non-woven Papers using XPS
  • Evaluation of Needle Systems for Dispensing Household Cleaning Agent.
  • FT-IR Analysis of Debris from a Steel Emboss Roller
  • Investigation into the Penetration of Polishes into Soft Wood by DSIMS.
  • Surface Composition / Silicone Distribution Studies on Four Dental Palates
  • ICP-OES Analysis of Hydrogen Peroxide-Containing Emulsions (1)
  • Desk Top Study into Candidate Needle Materials
  • Investigation into Packaging Films for Bath Foam Sachets
  • Headspace Analysis of Lacquered - Al Conditioner Tubes
  • Investigation into the Interaction between Stainless Steel Needle Materials and Peroxide Based Acidic Cleaning Solution.
  • Characterisation of the Surface Chemical and Physical Condition of Porcelain Materials
  • Investigation into the Internal Structures of Two Pairs of Thermoplastic Elastomer Pellets using Scanning Electron Microscopy
  • Surface Analysis of Aluminium/Polyethylene Foil Sachets using ToF-SIMS and XPS
  • Determination of Lubricant Coverage of Filter Tow Fibres by SIMS
  • XPS Characterisation of Polymer Coated Polycarbonate and Stainless Steel Substrates
  • Assessment of Feasibility of ToF-SIMS and XPS for 'Turn-Key' Surface Analysis of Treated Hair Specimens
  • A Surface Analysis Study into Possible Causes of Failure of Circuit Boards Operating in a Cellulose Fibre Production Environment
  • Analysis of Gas Permeation from Packs of Anti-bacterial Wipes Using Gas Chromatography
  • Analysis of Particulate Matter on Filter Paper using X-ray Photoelectron Spectroscopy
  • Evaluation of Candidate Polymer Materials for use as Conveyor Belts
  • A Secondary Electron Microscopy Study of the Cause of Leakage of Bleach Cap Modules
  • Analysis of the Fouling Agent on a Hollow Fibre Membrane Filter using ToF-SIMS
  • Characterisation of Water Tank Cloth Strip using X-ray Photoelectron Spectroscopy
  • Investigation of Polyurethane Foam Discolouration by ToF-SIMS
  • An Investigation into Blistering on Pre-Pasted Wallpaper using ToF-SIMS and XPS
  • Analysis of a Series of Cotton Swatches using X-ray Photoelectron Spectroscopy (XPS)
  • Investigation into the Cause of Blue Discolouration of Customer Returned Fabrics using ToF-SIMS
  • Analysis of Hollowfibre Membrane Filters and Reference Solutions using XPS.
  • Investigation into the Embrittlement of PET Colourant Containers using ToF-SIMS
  • ToF-SIMS Investigation into the Variable Ink Receptivity of Printed Wall Papers
  • Investigation into the Release Coat on a Self-Adhesive Border Wallpaper using XPS.
  • ToF-SIMS Analysis of Oil Residues on Double-Edged Razor Blades
  • A LIMA Investigation of Particulate Contamination and Filliform Corrosion on Razor Blades Edges.
  • Surface Characterisation of Oxidised Steel and Polycarbonate Coupons using XPS.
  • ToF-SIMS Analysis of Detergent Granules : Investigation of Surface vs. Bulk Composition
  • An XPS Investigation of the Cause of Gloss Damage to Enamel Tiles after Product Treatment
  • A Combined Contact Angle / XPS Investigation of the Safe Operating Window of Bleach Container Cap Modules
  • XPS Analysis of Fluoride Uptake on Etched Human Molar Teeth.
  • XPS Analysis of Fluoride Uptake on Treated Human Molars.
  • XPS Analysis of the Surfaces of Human Teeth
  • Surface Analysis of Failed Dehumidifier Rotor Using ToFSIMS
  • Analysis of Dental Palates using ToF-SIMS
  • Study into The Corrosion of Glass using Dynamic Secondary Ion Mass Spectrometry
  • Investigation into Contamination of UV-Cured Varnish using ToF-SIMS
  • Analysis of Treated Polycarbonate and Steel Samples using XPS.
  • Analysis of Conditioner Treated Hair Specimens using SIMS
  • Photographic Evaluation for Limescale Remover Investigaitions
  • Investigation into the Efficacy of Lime Scale Removers on Chrome Taps using Imaging SIMS
  • Pilot Study into the Corrosion of Glass by Cleaning Formulations using Secondary Ion Mass Spectrometry
  • Efficacy evaluation of Five Limescale Removal Products by Surface Analysis
  • Preparation and Comparative Simulated Rain Testing Cleaining Products on Glass Plates using Photography
  • Comparison of Efficacy of Glass Cleaner "A" versus Untreated Clean Glass in Rain Water Simulation Tests
  • Comparison of the Efficacies of Two Glass Cleaners A & B
  • An XPS Investigation of the Efficacy of Five Limescale Removal Products on Glazed Tiles and Taps
  • Comparative ToF-SIMS Studies of the Effects of Five Limescale Removal Products on a Series of Six Household Surfaces After Rinsing
  • Surface Analysis of various Plasma Treated Materials using X-ray Photoelectron Spectroscopy (XPS)
  • Investigation into Poor Lamination of Nylon Fabric using ToF-SIMS
  • An XPS investigation of shower cream container cracking under fatigue stresses.
  • XRD Analysis of a Brown Membrane Deposit
  • An XPS Investigation of Staining on a Reverse Osmosis Filtration System
  • Analysis of Contact Lenses using ToF-SIMS
  • Surface Characterisation of Modified Polyester Fibre Samples using X-ray Photoelectron Spectroscopy (XPS)
  • An XPS Investigation of Delamination Problems on Shampoo Sachets
  • XPS and LIMA analysis of chlorination treatments on surgeon's gloves.
  • Analysis of Precipitate using ToF-SIMS and XPS
  • Analysis of Crystalline Surfactant Samples using XPS and ToF-SIMS.
  • Analysis of Hairspray Treated Hair Specimens using ToF-SIMS
  • Demonstration XPS analysis of metal test coupons.
  • Comparison of the surface compositions of the unvarnished areas of good and bad foil laminated carton blanks by XPS
  • Evaluation of a New Polymer Coating System using XPS
  • XPS Feasibility Studies for the Determination of Molybdenum Concentrations at Tooth Surfaces
  • Further Analysis of Coated PMMA Tiles using ToF-SIMS
  • XPS Studies of the Surface Silicone Concentration and Distribution on PMMA Tiles
  • Analysis of Detergent Particles using Cryo-XPS and Cryo-ToF-SIMS
  • An Investigation into Delamination of Sachet Samples using XPS and ToF-SIMS
  • Characterisation of Detergent Materials using ToF-SIMS and XPS.
  • An Investigation of the Processing Technique for Washing Powder Manufacture using Time-of-Flight SIMS
  • Analysis of Blown Powder Samples using XPS
  • Investigation into the Migration of Species in Confectionery Materials by GC-MS
  • Analysis of Shampoo Sachets Showing Delamination using ToF-SIMS
  • The Characterisation of Two gemstones using XPS and Density Measurement.
  • Analysis of Shampoo Sachets Showing Differing Degrees of Delamination, using XPS
  • Surface Characterisation of Dish Cloths using XPS and ToF-SIMS
  • Analysis of Three Titanium Dioxide Powder Samples using Depth Profiling XPS
  • Further Analysis of Soap Powders using ToF-SIMS and XPS
  • To Compare the Coating Thickness for Two Titanium Dioxide Samples using Depth Profiling XPS.
  • Analysis of Jamming Piston from a Drink Dispenser using Time-of-Flight SIMS and Scanning Electron Microscopy.
  • Surface Analysis of Washing Powders
  • Nitrogen BET surface analysis of eight shredded tobacco sheets and two carbon samples
  • Surface composition analysis of cellulose nitrate membranes
  • An investigation of the effects of ageing on the surface chemistry of tin-plated brass anode conductors by XPS
  • An Investigation of the Surface Characteristics of Blood Stains on Cotton Fabric
  • XPS analysis of reference glass test panels.
  • Analysis of Treated Cotton and Polyamide Fabric Samples using X-ray Photoelectron Spectroscopy (XPS).
  • Angle dependent XPS and ToF-SIMS studies of the silicone distribution on treated tiles
  • LIMA analysis of particulates on test lenses after first stage cleaning improvements to production line.
  • LIMA analysis of surface defects in coated lenses
  • An XPS investigation of the surface chemistry of coated paper
  • XPS/LIMA analysis of blue inks on cheques
  • Determination of silicone distribution on tiles using ToF SIMS
  • XPS analysis of treated glass bottle surfaces
  • Analysis of Coatings on Titanium Dioxide Powders by EFTEM Analysis
  • Analysis of filter tow fibres by ToF-SIMS
  • Analysis of fouled water purification membranes using X-ray photoelectron spectroscopy (XPS)
  • Investigation of Cleaning Process on Polymer Films
  • An XPS study of the depth distribution of silicone within a two layer film on a nylon substrate
  • AES depth profiling study of nitride films on razor blade edges
  • An XPS/AES study of platinum coated carbon granules
  • A comparative XPS study of "good" and "bad" friction materials.
  • An XPS study of alumino-silicate cladding on TiO2
  • An XPS study of silicone distributions through cast hair conditioning films.
  • An XPS study of tarnishing and deposits on stainless steel cutlery
  • An XPS investigation of tackiness on the top surfaces of pads.
  • DSIMS Analysis of Gallium in a Glass Sample
  • DSIMS Depth Profiling of Coated Glass Samples
  • Surface Analysis of Treated Glasses
  • Surface Area Measurement (BET) Analysis of Glass Fibre Samples
  • Analysis of Specks on Glass Interleaving Paper
  • Bulk Composition of a Glass Sample by XRF
  • Investigation into Visual Defects at Methacrylate Bonded Glass Bevel Interfaces.
  • Investigation into Blockage of Glass Bores used in Max/Min Thermometers
  • Surface Analysis of HF-Treated Toughened Glass
  • ToF-SIMS Analysis of Non-Wetting on Epoxy-Coated Glass Bottles
  • Surface Analysis of Glass Faces from an IG Double Glazing Unit
  • Investigation of Spotting on Glass Panels
  • XPS Analysis of Glass and Metallic Devices
  • Analysis of Indices and Coated Glass Capillaries following Improved Coating Processes using XPS
  • Surface Analysis of Egg Soiling on Glass
  • DSIMS Analysis of Layer Structures on S-Glass and S-Glass Edge Deleted Samples
  • Investigation of Pin-Holing Effect in Black-Coated Glass.
  • Investigation into Changes in Wetting Behaviour of Glass X
  • Analysis of Sealant/Coated Glass Interfaces and Reference Samples
  • ToF-SIMS Analysis of a Residue on a Glass Vial
  • An Investigation into Adhesion Failure of Polymer Film on Glass using Surface Analysis Techniques
  • Investigation into the Cause of Defect Spots on Window Glass.
  • An Investigation into the Poor Adhesion of a Glass-Polymer Sealant on Double Glazing Units using XPS and ToF-SIMS
  • DSIMS Depth Profiling of Boron, Phosphorus and Germanium in Glass Films on Silicon Substrates.
  • Analysis of Two Glass Coated Wafers using X-Ray Photoelectron Spectroscopy (XPS).
  • DSIMS Depth Profiling of Boron in Glass Films on Silicon Substrates.
  • Analysis of Coated Glass Plate / Silicone Sealant Interfaces by XPS
  • Optical Examination of a Glass Panel for Significant Etching
  • Determination of the Efficiencies of Hand and Line Stripping Techniques on Glass Coatings by XPS
  • Surface Area Measurement (BET) Analysis of Three Glass Fibre Samples.
  • Optical Examination of Glass Panels After Environmental Exposure.
  • An Investigation into the Poor Adhesion of a Glass - Polymer Sealant on Double Glazing Units using XPS and ToF-SIMS.
  • Analysis Of Competitor Coating On Glass Microfibre Paper using XPS and ToF-SIMS
  • Surface Analysis of the Stripped Perimeter of Coated Glass Panels by XPS.
  • Investigation into the Surface of Protein Layers Attached to Self Assembled Monolayers on Gold Coated Glass using XPS
  • To Determine the Effects of Various Treatments on the Surface Compositions of Glass and Polymer Vials using XPS.
  • Investigation into the Bonding of Glass Fibre Filled Polymer Plaques using Surface Analysis Techniques.
  • Surface Analysis of Glass Vials by XPS to Identify the Cause of Hazing and Flaking Failure
  • Investigation into the Cause of Interfacial Failure on Multi-layered Glass Window Structures Using Time of Flight SIMS and XPS
  • Investigation into Coating Failure on Windscreen Glass using ToF-SIMS
  • Analysis of Glass Ampoules using ToF-SIMS
  • Comparative Surface Characterisation of Two Solar Cell Cover Slip Glasses using ToF-SIMS
  • Study into The Corrosion of Glass using Dynamic Secondary Ion Mass Spectrometry
  • Surface Characterisation of Ceramic, Glass and Stainless Steel using ToF-SIMS
  • A Further Investigation into Metallised Coating Failure on Glass Bottles using Surface Analysis
  • Analysis of a Soiled Fibre Glass Filter using ToF-SIMS
  • An SEM and LIMA Study of "Mottling" in Enamel Coatings on Glass.
  • LIMA Analysis of Two Defects on Coated Glass.
  • Analysis of "White Spots" in a Black Glass Coating using X-ray Photoelectron Spectroscopy (XPS).
  • Study into the Corrosion of Glass by Cleaning Formulations using Secondary Ion Mass Spectrometry
  • A LIMA, XPS and DSIMS Analysis of Particulate Contamination Between Glass Plates of LCD Displays
  • Analysis of White Deposits at the Surface of Glass Tubes using X-ray Photoelectron Spectroscopy
  • ToF-SIMS Analysis of an Organic Coating on Glass
  • SIMS imaging of treated glass samples
  • Comparison of Efficacy of Glass Cleaner "A" versus Untreated Clean Glass in Rain Water Simulation Tests
  • Comparison of the Efficacies of Two Glass Cleaners A & B
  • Analysis of Cleaner Treated Glass Panes using ToF-SIMS and XPS
  • Sample Preparation for an Investigation of Glass Surfaces after Treatment with Various Glass Cleaning Fluids using Surface Analysis
  • An XPS study of the structure of an organic coating on glass.
  • An XPS Investigation of Discolouration of Titanium Films on Glass
  • Analysis of Glass Coated Alloy Samples using X-ray Photoelectron Spectroscopy (XPS).
  • AES depth profiling characterisation of an optical coating on glass.
  • An investigation of the origin of a glass fragment found in drug packaging
  • Investigation into the Variable Adhesion of Aluminium Film Bonding to Glass Beads using X-ray Photoelectron Spectroscopy (XPS)
  • Comparison of Frosted and Non-Frosted Glass Surfaces using X-ray Photoelectron Spectroscopy (XPS)
  • LIMA analysis of fine white crystalline deposit on the inside of amber glass bottles.
  • An Investigation into Adhesion Failure between Glass and Seal, After UV Exposure, using X-ray Photoelectron Spectroscopy.
  • XPS analysis of reference glass test panels.
  • Surface analysis of four plate glass samples using X-ray Photoelectron Spectroscopy (XPS)
  • Determination of the Nature of the Contamination on the Outer Surface of Glass Needle Samples, using X-ray Photoelectron Spectroscopy (XPS)
  • An XPS investigation of defects in ITO coated glass
  • XPS analysis of treated glass bottle surfaces
  • XPS elemental analysis of white deposit on glass bottle rim
  • An XPS study of a white deposit and pale spots on amber glass bottles
  • Surface analysis of the internal walls of four glass vials using X-ray photoelectron spectroscopy (XPS)
  • A LIMA study of particulates on glassine papers
  • An XPS study of white deposits on brown glass bottles.
  • XPS Analysis of Stains on Aluminium MDC Can Lids.
  • XPS Analysis of Platinum Catalysts
  • ToFSIMS Investigation of Yellow/Orange Staining on an Aluminium Cap
  • Analysis of “Orange” Coloured Stain on a Gold Coated Pin
  • ToFSIMS and XPS Investigation of Possible Poisoning of Platinum Catalysts
  • GDMS Analysis of Five Aluminium Samples
  • Analysis of Coated Wires Showing Different Responses to Coulometric Tests
  • Surface Analysis of a Steel Strip
  • Surface Analysis of Strips of Steel for Oil Residues Remaining After Cleaning
  • Surface Analysis of a Steel Strip for Slitting Oil Residue using XPS and ToF-SIMS
  • Analysis of Strip Steel for Oil Residues using XPS
  • Investigation into the Poor Feedability of Welding Wires by Surface Analysis Techniques
  • DSIMS Analysis of Nickel Alloy Sections for Hydrogen Diffusion Profiles
  • A Multi-Technique Characterisation of the Surface of Stainless Steel Strip for Razor Blades
  • Quantitative Analysis of Powder Debris Extracted from Strip Stainless Steel.
  • Surface Analysis of Flux Cored Welding Wires using Surface analysis
  • Analysis of Brown Stains on Aluminium Cans
  • Investigation into the Surface Cleanliness Condition of Stainless Steel Strip.
  • Analysis of Particulate Material Collected on Wiper Pad
  • XPS and ToF-SIMS Analysis of Staining at the Edges of Strip Steel for Tubing.
  • Analysis of White Marks on Aluminium Cans using XPS
  • Investigation into the Cause of Corrosion Spots in Chemically Polished and Anodised Aluminium Ferrules.
  • Analysis of Aluminium Discs
  • A Multi-Technique Characterisation of the Surface of Stainless Steel Strip for Razor Blades.
  • Aluminium Oxide Thickness Determination on a Set of Aluminium Discs
  • Investigation of Dark Spots on Tempered Stainless Steel Razor Strip.
  • Analysis of Metallised Paint on a Counterfeit Coin
  • Surface Analysis of a Stained Aluminium Sheet Using ToFSIMS and XPS
  • Analysis of Staining on Stainless Steel Mass Spectrometer Rods by XPS
  • An Investigation into the Cause of Blister Formation on Coin Blanks.
  • Depth Profiling Analysis of Treated Aluminium Samples
  • Characterisation of the Surface Layers on Aluminium Discs using X-ray Photoelectron Spectroscopy
  • XPS Depth Profiling of Pre-Treated Aluminium Alloy to Determine Coverage Consistency and Composition
  • Analysis of Copper Rods to Investigate Differences in Surface Colouration, using XPS
  • GDMS Analysis of Aluminium Samples
  • AES Analysis of Surface Treated Ferrite Powder Agglomerates.
  • DSIMS Studies of A Corrosion Problem on Welding Wires
  • Analysis of Localised Corrosion Features on Welding Wire Strands using XPS
  • Investigation into an Aluminium Printing Substrate Containing Localised Defects using Secondary Ion Mass Spectrometry
  • Surface Chemical Characterisation of a Wear Track on a Steel Test Roller Bearing Using X-ray Photoelectron Spectroscopy (XPS)
  • Comparative Surface Analysis of Two Steel Discs using ToF-SIMS
  • Impurity Analysis of Tin-Coated Brass Wire by Dynamic SIMS
  • Surface Analysis of Copper Wires using X-ray Photoelectron Spectroscopy.
  • An Investigation into the Discolouration of Copper Wire Samples using X-ray Photoelectron Spectroscopy (XPS)
  • Surface Characterisation of Three Pickled Iron Powders using X-ray Photoelectron Spectroscopy (XPS)
  • High Resolution Quantitative XPS Analysis of Compressed Iron Powder Rings.
  • Surface Analysis of Flux Cored Welding Wires using XPS and SIMS.
  • Surface Analysis of Welding Wires by SIMS
  • An XPS/AES analysis of contamination and surface structure on tin plated superconductor wires.
  • Analysis of Discolouration on an Electro-Polished Steel Surface using X-ray Photoelectron Spectroscopy (XPS)
  • Analysis of Contaminated Metal Blocks using ToF-SIMS
  • Surface Analysis of Cleaned Aluminium Coated Steel Samples using X-ray Photoelectron Spectroscopy (XPS).
  • XPS/AES analysis of passivated nickel foil
  • Determination of the Purity of an Aluminium Sample Using GDMS
  • XPS analysis of blister on aluminium coated steel
  • An XPS study of defect spots on zinc plated steel
  • An AES/SEM/EDX study of coated ball and roller probe components
  • Analysis of Metallised Polyester Films by XPS
  • Analysis of Stains on Aluminium Ferrules and Cans
  • Comparative Analysis of the Dispersed Coating on Two Aluminised Papers using ToF-SIMS
  • Analysis of Coated and Metallised Paper Samples using XPS.
  • An Investigation into Blooming of Metallised Paper using XPS.
  • Comparative Surface Analysis of Reference and Problem Chromium-Coated Steel Plates by ToF-SIMS
  • Characterisation of Deposits on Aluminium Cans using XPS and ToF-SIMS.
  • Investigation of Lacquer Breakdown on Aluminium Cans using XPS and ToF SIMS.
  • To Investigate the Cause of Pin-Hole Leakage of Beer Cans
  • An XPS and AES Depth Profiling Study of Chromium Phosphate Treated Aluminium.
  • Comparative Analysis of the Surface Compositions of Two Steel Plates by XPS
  • Analysis of Crater Defects on PVC Coated Aluminium and PVC Solutions using ToF-SIMS and ICP
  • DSIMS Analysis of Aluminium Plate Samples
  • ToFSIMS Analysis of an Artificial Skin Sample
  • SIMS Depth Profiling of Three Printing Plates
  • Characterisation of the Glossy Coated Side of Photographic Paper
  • ToFSIMS and XPS Analyses of Photographic Papers
  • ToFSIMS Investigation of Blue Spots on Interleaf Paper of a Photo Album
  • Investigation of Migration/Intermixing of Layer Components in Coated Plates
  • SIMS Imaging Analysis of Anodised Aluminium Plates
  • ToFSIMS Analysis of Photographic Inkjet Paper
  • ToFSIMS Characterisation of a Black Ink Layer on Inkjet Paper
  • ToFSIMS Analysis of Red Spots on a Photograph
  • Surface Analysis of Furnaced Zirconia Tiles
  • LSOM Investigation of Surface Texture Distribution of Laminated Print Paper.
  • Investigation of Coating Defects on Aluminium Substrates using ToFSIMS and XPS
  • SIMS Characterisation of the Glossy Coated Side of Three Photographic Papers
  • Analysis of Spot Defects on a Coated Aluminium Substrate
  • Investigation of Nitrogen Contamination in Film Canister and Lid
  • Analysis of Two Competitor Photographic Papers using ToFSIMS
  • Analysis of Glossy Competitor Photographic Paper using SIMS
  • ToFSIMS / XPS Investigation into the Appearance of a Milky Precipitate Layer on the Surface of an Ink-Coated Paper
  • Analysis of a Competitor Photographic Paper using SIMS.
  • XPS Analysis of Coated Aluminium Plates
  • Analysis of White Spot Defects in Gelatine Coated Photographic Paper
  • Analysis of Photo Film Strip by XPS
  • To determine fluorine concentrations in the top protective layer of a series of photographic film strip samples
  • DSIMS Analysis of Thermal Plates
  • ToF-SIMS Investigation of Poor Lacquer Adhesion
  • Depth Profiling SIMS Analysis of Eight Printing Plates
  • ToF-SIMS Analysis of Delaminating Photographic Paper
  • Analysis of Electrolytically Grained Aluminium
  • Investigation into the Effect of Corona Treatment on Paper and Inks using XPS
  • Surface Characterisation of Gum Coatings on Offset Plates using ToF-SIMS
  • Overview Report on Depth Profiling SIMS Analysis of Various Printing Plates
  • Determination of Dye Molecules on the Surface of a Thermal Plate using ToF-SIMS
  • Analysis of Coated Metal Plates for Film Cartridges by XPS
  • Study of the Layer Composition of a Thermal Plate using Depth Profiling SIMS
  • Investigation into the Transfer of Fluoro-surfactant between the Surfaces of Lithographic Films by XPS
  • Surface Chemical Characterisation of Photographic Papers using XPS and ToF-SIMS
  • DSIMS Analysis of Three Printing Plate Samples
  • Characterisation of Various Corona Treated PE Films by XPS and ToF-SIMS
  • Investigation into Surface Composition Differences Between Photo Colour Paper of Differing Performance, Using XPS and ToF-SIMS.
  • SIMS Imaging of Gelatin-Coated Matt Photographic Paper
  • Characterisation of the Surface of Colour Photographic Paper by XPS
  • Analysis of the Internal Surface of UV/ozone Treated Film Cases by XPS
  • Analysis of the Internal Surface of Photo Film Cases by XPS
  • Investigation into the Effects of Surface Treatments on Polyethylene Coated Paper using XPS.
  • Characterisation of the Surface of an Aluminium Offset Print Plate by SIMS
  • Characterisation of Aluminium Printing Plates using XPS.
  • Investigation into the Uniformity of Gelatine Coating on Polyethylene by Imaging SIMS
  • A Comparative XPS Study of Haze on Developed Photographic Papers
  • An Investigation into Discolouration of Metallic Areas of Photo Film Cases using X-ray Photoelectron Spectroscopy (XPS).
  • Analysis of Colour Photographic Papers by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
  • Analysis of Colour Photographic Paper by X-ray Photoelectron Spectroscopy.
  • Surface Composition Analysis of Negative Photo Film using X-ray Photoelectron Spectroscopy (XPS)
  • Investigation of Coating Failure using X-ray Photoelectron Spectroscopy (XPS).
  • An investigation into paint failure from a power station using X-ray Photoelectron Spectroscopy (XPS).
  • Analysis of Reservoir Rocks using ToF-SIMS
  • Combined XPS and ToF-SIMS Analysis of a Corroded and Fractured Metal Storage Drum.
  • An Investigation into the Cause of Pin-Holing in the Metal Surface of a Failed Pressure Transmitter using XPS
  • An investigation of the effects of additives on drill string lubrication by XPS
  • An XPS study of deactivation of tungsten / silica dehydration catalysts
  • An XPS Comparison of the Internal and External Surface Compositions of Two Palladium/Gold on Silica Catalysts
  • Studies of Asphaltenes and their Adsorption to Steel and Quartz Surfaces
  • Determination of the titanium oxidation state on a selection of polymerisation catalysts
  • A Feasibility Analysis of Conducting Resin Mounted Catalyst Sections using Imaging Time-of-Flight SIMS
  • XPS analysis of Catalyst
  • An XPS investigation of the relationship between the surface chemistry of modified polymer films and their heat sealing properties
  • Interfacial Analysis of Wax
  • XPS Analysis of Solvent Cleaning Methods for Mud Filtrate Removal
  • Analysis of Inhibitor Reference Samples using X-ray Photoelectron Spectroscopy
  • Analysis of Solar Cell Pieces using Depth Profiling SIMS
  • Surface Analysis of a Novel Inhibitor Blend and Associated Test Cell Treated Steel Coupons using ToF-SIMS and XPS
  • Characterisation of Scale Inhibitors and a Study of Corrosion Inhibitors in the Presence of the Scale Inhibitors using XPS.
  • Characterisation of scale grown in Forties brine by X-ray photoelectron spectroscopy Inhibitor treated
  • Investigation of thick corrosion product grown in forties brine on cone specimens by ToF SIMS
  • An Investigation into polyethylene coating failure on steel tubes using ToF SIMS
  • SIMS Analysis of Turbine Blade Deposits
  • Analysis of Copper Pipe Section using ToF-SIMS
  • LIMA analysis of corroded metal pipe treated with lithium chloride solution
  • Characterisation of Deposits on Corrosion Test Coupons using X-ray Photoelectron Spectroscopy (XPS)
  • Characterisation of Steel Coupons After 10 min Exposure to Inhibitor X Solutions, using Angle Dependent XPS
  • Analysis of two inhibitor coated samples, to assess coating thickness and uniformity of composition, using depth profiling XPS.
  • Analysis of Metal Oxide Catalyst and PVC Sample using X-Ray Photoelectron Spectroscopy (XPS).
  • Combined XPS depth profiling and imaging studies of wear films on blocks
  • XPS depth profiling studies of lubricant films on blocks
  • DSIMS Analysis of Solar Cells
  • Depth Profiling SIMS Analysis of Anti-Reflective Coating on Silicon and two Silicon Wafers
  • Analysis of a Soiled Fibre Glass Filter using ToF-SIMS
  • Analysis of Carbonaceous Deposits and Flakes on Engine Plugs using X-ray Photoelectron Spectroscopy (XPS).
  • XPS Wettability Assessment and Imaging of Core Samples.
  • Wettability by XPS Analysis of Core Samples Cleaned in Cyclohexane.
  • DSIMS Analysis of a Titanium Dioxide - Coated Silicon Wafer.
  • DSIMS Analysis of Rainbow Stain on Aluminium Fuel Test Specimen
  • Determination of the surface composition of four alumina supported Co/Mo/P catalysts using X-ray photoelectron spectroscopy (XPS)
  • Determination of Dioctyl-Dimethyl-Ammonium Chloride, Formaldehyde and Gluteraldehyde Concentrations using the Kjeldahl and HPLC Methods.
  • Identification of an Unknown Quaternary Amine in a Biocide using ToF SIMS
  • SEM/EDX analysis of mineral sludge deposits on Millipore filter papers
  • Surface composition analysis of mineral sludge deposits on Millipore filter papers
  • XPS analysis of pipeline corrosion test samples
  • Investigation into the Effect on Metals of Increased Chloride Levels in Effluents at a Sewage Works
  • DSIMS Analysis of Wear Scars Formed in Two Lubrication Tests
  • An investigation of the effects of additives on drill string lubrication by XPS
  • An Investigation into Staining on Steel Bearings using X-ray Photoelectron Spectroscopy.
  • XPS Depth Profiling Studies of the Effects of the Running In Period on the Wear Film on Steel Bearings
  • An XPS/AES Investigation of Excessive Wear on Alternator Bearings
  • XPS Depth Profiling Analysis of Coated Steel Bearings
  • An XPS investigation of staining on the backs of two steel bearings
  • Investigation into Release Agent Formulation for Hot Stamping Foils using ToFSIMS
  • Analysis of Model Tablet Formulations using Surface Analysis Techniques
  • Pilot Study into the Corrosion of Glass by Cleaning Formulations using Secondary Ion Mass Spectrometry
  • Hardness Profile Measurement on a Motor Cycle Cam Shaft
  • Characterisation of Plasma Nitrided Stainless Steel Surfaces
  • Analysis of Diesel Engine Cams and Followers
  • DSIMS Analysis of Wear Scars Formed in Two Lubrication Tests
  • Analysis of Steel Surfaces from Friction Tests Performed at Different Temperatures
  • Analysis of Two Gear Teeth Sections
  • Investigation into Pitting of Motorcycle Gear Teeth.
  • ToF-SIMS Analysis of Lubricant Residues on Gear Teeth
  • Characterisation of a Ceramic Exhaust Gas Trap using Surface Area Measurement Techniques
  • XPS and ToF-SIMS Analysis of the Dark Film Deposit on a Gear.
  • Analysis of Ceramic Exhaust Trap Washings
  • Analysis of Cam Shafts and Followers
  • SIMS Analysis of Clutch Plate Component
  • Analysis of Unknown "Bonder" Coating on Steel using XPS
  • An XPS study of brown staining on steel specimens pressed using a lubricant.

Next Steps
Coating Characterisation
Contamination / Stains
Material Control
Topography
Example Reports