Contamination / Stains

Contamination of materials can be present as visible or invisible stains, fibres and particulates as well as liquids. Even at low level these contaminants can lead to materials failing.

Techniques such as XPS, SIMS, GC/MS and SEM/EDX can be utilised to identify contaminants as low as one atomic layer on a surface/ppb range and quantify elemental and molecular composition whilst suspect materials can be fingerprinted in order to identify the source of the contamination and eradicate it.