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Surface Analysis Workshop - February 2009

The next CERAM surface analysis workshop will be held on Thursday 26th February 2009.

The workshop will be split into a morning of presentations on the main techniques including industrial case studies and an afternoon of laboratory demonstrations.
There will also be opportunities to meet the CSMA scientific team during coffee and lunch.
Attendees are invited to bring a sample for discussion with a member of CSMA’s scientific team.

Programme:

09.30-10.00	Registration and coffee
10.00-10.15	Welcome and Introduction Dr. Chris Pickles, Managing Director
10.15-10.50	Quantitative Surface Analysis and Chemical State Mapping Dr Len Hazell
10.50-11.25	Surface Topography and Layer Thickness Measurement Dr. Alan Brown
11.25-11.50	Coffee
11.50-12.25	Molecular Imaging of Surfaces Dr. Jean-Claude Canry
12.25-13.00	Elemental Composition of Sub-Surface Layers and Interfaces Dr. Alan Brown
13.00-14.00	Lunch
14.00-16.30	Laboratory demonstrations on: XPS (X-ray Photoelectron Spectroscopy) 3DP (3D Non-Contact Surface Profiling) ToFSIMS (Time of Flight Secondary Ion Mass Spectrometry) DSIMS (Dynamic Secondary Ion Mass Spectrometry) depth profiling.

Please indicate your preferred demo on the registration form.

There will be time for one-to-one discussions on specific samples.

Coffee will be available throughout the afternoon.

To download the registration form (Word document, 178KB), right-click on the link above and choose 'Save Target As...' to save the document.

For further details or to register to attend the workshop please contact Rob Mitchell, e-mail rob.mitchell@ceram.com , tel +44 (0)1782 764269.