Newsletter - January 2007

CSMA took delivery of a Kratos Axis Ultra XPS in December 2006

The increased capabilities include:

Quantified elemental depth profiling by ion beam etching as well as non-destructive angle-resolved depth profiling. This depth profiling capability allows the analysis of buried defects and interfaces. Problems such as delaminations and migration of species can be analysed.

High resolution of data.
As can be seen in the spectra below the new instrument provides data with less peak overlaps. This increase in resolution will allow previously difficult chemical-state information, such as the oxidation-states of gold, to be resolved.

Figure 1: XPS Spectra

Elemental and oxidation-state imaging. Previously elemental mapping by EDX and molecular imaging by ToFSIMS has been available however now CSMA has the capability to image functional information quantitatively. The example below shows a treated medical grade fabric sample, the C-C bond of the PP substrate is coloured red whilst the C-O bond of the coating, designed to inhibit the adhesion of proteins and cells, is coloured green.

Figure 2: XPS Chemical-state Image

Small area analysis. Features as small as 15 microns can now be analysed.
Bond Pad Contamination on an electrical component was investigated utilising the new feature. An image was acquired and two areas were then retrospectively analysed with the 55micron spot size. The image below shows the areas whilst the spectra show the differences between the two areas. The contamination was identified and eliminated.

Figure 3, Optical Image highlighting Analysis Points and Retrospective Spectra

Surface Analysis Workshop

CSMA is holding a surface analysis workshop on the 28^th February. The day will be based on educational presentations, including case studies, in the morning and practical demonstrations in the afternoon. A unique opportunity to meet CSMA's technical staff and learn about the benefits of surface analysis. Attendees can also bring along a sample for one-to-one discussions and advice.

For further information or to register please contact Jemma Melvin on +44 (0)1782 764269 or jemma.melvin@ceram.com

A Complete Service!

A combination of 3DP and ToFSIMS analysis provided the answer to a defective food packaging system. A metallised packaging system was failing during storage. Optical inspection suggested the internal coating was causing the problem. The combination of techniques allowed the coating defects to be characterised both physically and chemically. Below is an example of the coating defect shown as a 3DP image, clear pits were observed in the surface. The chemical information showed organic contamination had formed around the defect pits. The data provided was utilised to eliminate the source of the contamination and improve the coating.

Figure 4: 3DP Image showing Topographical Fault

CSMA Conferences & Exhibitions

Law 2007 and MEDTEC Ireland 07

Law 2007 is the largest legal technology training congress and exhibition in London. CSMA will be jointly exhibiting with CERAM, CSMA’s parent company. Shaun Bainbridge will be available to discuss CSMA’s services to the legal sector.

Law London 2007 will be held at Olympia 2, London on 14th & 15th March.

After successful exhibitions at both MEDTEC 06 and MEDTEC 05 CSMA will again be exhibiting at MEDTEC Ireland 2007 on the 19^th and 20^th Sept at the Radisson SAS hotel in Galway. CSMA will be on stand 219 where Ursula Thompson will be available for discussions on the benefits of surface analysis to the medical device industry. Dr. Alan Paul will also be giving a presentation, outlining recent development in ToFSIMS analysis, including small and large area imaging.

For further information or to pre-book an appointment please contact Jemma Melvin on +44 (0)1782 764269 or jemma.melvin@ceram.com