Latest News - CSMA January 2006 Newsletter

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Newsletter - January 2006 CSMA now has Representatives in Ireland and the Benelux Areas Ursula Thompson joined in October 2005 as Technical Sales Representative for Ireland. (North and South) An honours Chemistry graduate, Ursula has 15 years experience in analytical instrumentation with a background in applications development, troubleshooting and sales. Contact Ursula: Telephone: +353 (0)46 9487671 Mobile: +353 (0)86 8165746 E-mail: ursula.thompson@ceram.com Postal Address: CSMA Ireland, PO Box 85, Athboy, Co. Meath, Ireland. Seija Aalto started work for CSMA this month. Seija will be the first point of contact for customers in the Benelux area. With an MSc in organic chemistry and experience of polymer and biomedical research Seija is ideally placed for technical discussions and on-site visits. Contact Seija: Telephone: +31 765617494 Mobile: +31 655892654 E-mail: seija.aalto@ceram.com
Further Info on MATS-UK In the last issue of the CSMA newsletter MATS-UK had just arrived on site. MATS have now fully integrated into CSMA bringing particular expertise in the semiconductor and coating industries. Examples of work: Measurement of B and P levels in BPSG layers. Determination of stiochoimetry of a variety of nitrides and oxides on silicon. Non-destructive investigation of delamination of device components on ICs. Proprietary multi technique approach to measure the thickness of oxide on metal powders and fibres. Our analytical suite now includes: • SNMS (Sputtered Neutral Mass Spectrometry) • ULE-SIMS (Ultra Low-Energy Secondary Ion Mass Spectrometry) • RBS (Rutherford Backscattering Spectroscopy) • SAM (Scanning Acoustic Microscopy) • TEM (Transmission Electron Microscopy)
Latest Image from the Imaging ToFSIMS and News from the Open Days A host of clients from industries including pharmaceutical, electronics, coatings, packaging, medical device attended the ToFSIMS imaging open days in October/November. Following a brief basic theory in surface SIMS analysis the attendees were treated to a demonstration on the powerful molecular imaging possible with the new Bismuth source IONTOF V. Most clients brought in their own samples which were analysed during the sessions, free-of-charge. Several process/product issues were solved on the day or shortly afterwards following further interpretation of data. In addition clients took away high resolution chemical maps showing spatial distribution of sometimes complex species with sub micron resolution. Increasingly these images are being commissioned for marketing purposes. To cope with demand further open days are planned every Tuesday and Thursday throughout February on the following days: Tuesdays: February 7th, 14th, 21st, 28th Thursdays: February 2nd, 9th, 16th, 23rd. The general feedback was that clients preferred the variety thrown up when the open days were held across market sectors rather than for specific market sectors so this format will be continued. Client confidentiality is maintained during the Open Days but if you would prefer a "private viewing" please let us know! Examples of images gathered on an open day are below, they show an electronic device. Positive ion images from the centre of the device. Three-colour positive ion overlay from the centre of the device. Blue-Aluminium Red-Silicon Green-Magnesium