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Newsletter - September 2005


New ToFSIMS Imaging System Arrives

A new Ion ToF V Imaging ToFSIMS Instrument has arrived adding a new dimension to CSMA capabilities.
The new instrument allows wide scans which can be retrospectively chemically mapped.
Complex chemistries can now be resolved with sub-micron resolution.

Run your free sample at one of our ToFSIMS open days

CSMA warmly welcome you to attend our targeted open days to experience the power of the new imaging ToFSIMS system.
The first selection of open days planned are:
• October 4th-Packaging (Board, Polymer, Metal)
• October 6th-Electronics and Semiconductor
• October 11th-Medical
• October 13th-Pharmaceutical
• October 18th-Coatings
• October 20th-Small Particle Defects
• October 25th-Delamination & Disbondment
• October 27th-General

During the open days there will be the opportunity to learn the theory of ToFSIMS,
assess the capability of the new system and run a sample of your choice.

Samples will be run on a first come first served basis with prior receipt of samples preferred.

To reserve a place at one of our open days please contact:
Jemma Melvin
Tel +44 (0)1782 764269
E-mail jemma.melvin@ceram.com



CSMA exhibits at MEDTEC 2005

Visit CSMA on Stand 116 at the Radison Hotel, Galway, Ireland from 28th-29th Sept. Staff will be on hand to discuss CSMA's services to the medical industry as well as demonstrating the new Interpreter system.
This will be the first opportunity to discuss the increase in capabilities due to the recent merger of CSMA and MATS-UK.



Get your free copy of CSMA's Development and Problem Solving Guide

For your free copy of the CSMA development and problem solving guide please contact:

Jemma Melvin
Tel +44 (0)1782 764269
E-mail jemma.melvin@ceram.com