Coating Characterisation

As coatings are becoming increasingly complex the need to characterise not only the outer surface but the multiple-layers beneath the surface has become increasingly important.

Utilising depth profiling techniques such as SIMS, SNMS and XPS, multi-layer systems can be characterised from the outer nm through to 40microns giving quantified information with depth.

This information can be utilised:

• To identify the site of a failure such as a delamination or disbondment
• To resolve a patent dispute
• As part of a routine quality control testing schedule to ensure the coatings are being deposited correctly.